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Mill – Ion Beam System Sistem za jedkanje z ionskim žarkom / Ion beam milling device

Creates near-perfect surfaces of materials for microscopy using accelerated argon ions. Capable of cross-cuts (4 mm x 1 mm) and surface milling of 25 mm2 areas. Includes a cooling stage for heat sensitive materials.

Microscopy Laboratory
Equipment model
Leica EM TIC 3X Triple Ion Beam Milling System with Cross sectioning holder kit